CH3715 Introduction to Analysis of Materials
Academic year
2025 to 2026 Semester 2
Curricular information may be subject to change
Further information on which modules are specific to your programme.
Key module information
SCOTCAT credits
10
SCQF level
SCQF level 9
Planned timetable
Monday & Tuesday; 14:00-15:00 (lectures)
Module Staff
Dr R T Baker
Module description
The objective of this module is to introduce the principles of the most popular materials analysis methods using X-ray, ion beams, electrons and diffraction methods. The module will cover analytical principles of scanning and transmission electron microscopy (SEM, TEM), X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) together with secondary ion mass spectroscopy (SIMS) and X-ray Diffraction methods (XRD). Diffraction techniques will also be covered with the introductory aspects of Electron Energy Loss Spectroscopy (EELS) together with vibrational spectroscopic techniques.
Relationship to other modules
Pre-requisites
BEFORE TAKING THIS MODULE YOU MUST PASS CH2701 AND PASS AT LEAST 1 MODULE FROM {CH2501, CH2601, CH2603}
Assessment pattern
2-hour Written Examination = 100%
Re-assessment
Oral Re-assessment = 100%
Learning and teaching methods and delivery
Weekly contact
2 x 1 hr lectures per week; 2 - 3 tutorials over the semester
Scheduled learning hours
18
Guided independent study hours
82
Intended learning outcomes
- Gain knowledge and understanding of the working principles, practical operation and application of a wide range of materials characterisation methods
- Understand the types of information obtainable by these methods and appreciate their limitations
- Understand the benefits of using several techniques together in order to obtain a fuller understanding of the structure and composition of any specific sample