X-ray fluorescence
X-Ray Fluoresence (XRF) is a powerful non-destructive analytical technique which utilises high power x-rays to determine the elemental and chemical composition of a wide range of materials. The X-ray laboratory is currently equipped with a Spectro X-Lab EDPXRF, which is capable of analysing elements from Na to U and from sub-ppm to 100% for many elements. The X-Lab derives its analytical performance from the use of monoenergetic or polarised x-rays from secondary targets.
The interaction of X-rays with an object causes secondary (fluorescent) X-rays to be generated. Each of the elements present in the material produce X-rays with different energies. These X-rays can be detected and displayed as a spectrum of intensity against energy.
XRF has a wide application in industry and research due to its ability in providing high speed accurate and reproducible elemental analysis. XRF analysis is fast, accurate and non-destructive, and typically requires only a minimum of sample preparation.
Examples of recent applications include:
- Heavy metal analysis of plant and leaf material
- Major element analysis of high purity silica deposits,
- Sub-ppm determination of a range of elements in fuel
- Major and trace analysis of rocks and soils
- Qualitative elemental analysis of a range of ancient coins
Contact Angus Calder for information and assistance on X-ray fluorescence requirements.
