Electron microprobe
The School has a JEOL JCXA733 electron microprobe with three wavelength spectrometers which cover the element range from B to U. It also has advanced imaging facilities for SEM, back-scattered electrons and X-ray mapping. Most work is based on polished thin sections but other forms of solid sample may be studied. Most samples have to be coated with a thin film of carbon or other conducting element prior to study. [A scanning electron microscope with slightly better image resolution and a goniometer stage (but without a quantitative analytical facility) is available at the Gatty Marine Laboratory. As there is a cost to the School for using this facility, approval to use it should be obtained from Dr Stephens.]
Contact Donald Herd for information and assistance with electron microprobe and microscope requirements.
